Jornada Bibliography
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Use of low-temperature scanning electron Microscopy to compare and characterize three classes of snow cover. Scanning. 28:191-203.
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2006. Advances in theory, instrumentation, semiconductor, and materials applications of scanning microscopy. Scanning. 26:68-69.
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2004. Regional snow parameters derived from microwave radiometry. EOS Transactions, American Geophysical Union. 81:F445.
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2000.