@article {50651,
	title = {Advances in theory, instrumentation, semiconductor, and materials applications of scanning microscopy},
	journal = {Scanning},
	volume = {26},
	number = {2},
	year = {2004},
	month = {March 1, 2004},
	pages = {68-69},
	abstract = {It is important to monitor the development of seasonal snow cover classes (tundra, taiga, alpine, maritime, prairie and ephemeral) worldwide and to visualize and understand snow crystal metamorphism.  Low-temperature, scanning electron microscopy provides a superior form of snow crystal imaging and was successfully tested in taiga, alpine and prairie snowpacks with approximately 50\% of the total depth made up of depth hoar crystals.  The technique can be used easily for field data collection and provides a new tool for studying important snowpack processes with applications to avalanche and water supply forecasting.},
	keywords = {alpine, crystal, maritime, snow, taiga, tundra},
	url = {/files/bibliography/04-056.pdf},
	author = {J. Foster and A. Rango and E. G. Josberger and E. R. Erbe and C.D. Pooley and W.P. Wergin}
}
